Searched refs:testnum (Results 1 - 11 of 11) sorted by relevance
| /xsrc/external/mit/pixman/dist/test/ |
| H A D | rotate-test.c | 91 test_transform (int testnum, int verbose) argument 96 prng_srand (testnum);
|
| H A D | matrix-test.c | 121 test_matrix (int testnum, int verbose) argument 127 prng_srand (testnum); 210 testnum, i, diff); 216 testnum, i, diff);
|
| H A D | blitters-test.c | 233 test_composite (int testnum, int verbose) argument 252 max_width = max_height = 24 + testnum / 10000; 253 max_extra_stride = 4 + testnum / 1000000; 264 prng_srand (testnum);
|
| H A D | affine-test.c | 25 test_composite (int testnum, argument 51 prng_srand (testnum);
|
| H A D | composite-traps-test.c | 47 test_composite (int testnum, argument 78 prng_srand (testnum);
|
| H A D | glyph-test.c | 218 test_glyphs (int testnum, int verbose) argument 227 prng_srand (testnum);
|
| H A D | solid-test.c | 269 test_solid (int testnum, int verbose) argument 282 prng_srand (testnum);
|
| H A D | cover-test.c | 256 test_cover (int testnum, int verbose) argument 298 prng_srand (testnum);
|
| H A D | scaling-test.c | 49 test_composite (int testnum, argument 83 prng_srand (testnum);
|
| /xsrc/external/mit/pixman/dist/test/utils/ |
| H A D | utils.h | 137 uint32_t (*test_function)(int testnum, int verbose),
|
| H A D | utils.c | 783 call_test_function (uint32_t (*test_function)(int testnum, int verbose), argument 784 int testnum, 798 "r" (testnum), 802 retval = test_function (testnum, verbose); 856 uint32_t (*test_function)(int testnum, int verbose), 853 fuzzer_test_main(const char * test_name,int default_number_of_iterations,uint32_t expected_checksum,uint32_t (* test_function)(int testnum,int verbose),int argc,const char * argv[]) argument
|
Completed in 11 milliseconds